Researchers from a Czech university developed a device based on X-ray fluorescence for non-destructive analysis of materials. The analyses with standard devices determine elemental composition only in a selected spot on an investigated object. This device enables scanning of a selected area with a variable detection angle, which makes possible to obtain surface distributions of present chemical elements with approximate depth distributions. Partners interested in licensing agreement are sought.
Non-destructive chemical analysis of materials is one of the main methods in research and industrial production. The devices using stimulated emmission of X-rays are able to determine chemical elements present in surface parts of an arbitrary object. Almost all elements with an atomic number higher than 13 can be identified simultaneously in a few seconds.
Conventional XRF devices (analyzers using X-ray fluorescence) are able to analyze samples taken from an investigated object or to measure a selected spot on an object surface. This analytical approach is inappropriate for objects with heterogenous stucture, when analysis of one spot on a sample does not say anything about properties of the whole object.
The quick scanning of an object surface with the scanning X-ray fluorescence analyser, which was developed, can reveal differences in elemental composition. Apart from such identification of surface heterogeneities, the surface of an object can be scanned at various angles. It enables us to recognize the depth heterogeneities (layered structure) too.
The scanning X-ray fluorescence analyser finds its application wherever it is necessary to carry out non-destructive analysis of rather inorganic materials. These include metal, glass, paint and pigment industries, as well as research in the field of objects of cultural heritage.
The scanning X-ray fluorescence analyser can be easily combined with X-ray radiography.
The sample max. size is 50 cm x 50 cm x 40 cm (length x width x height).
The Czech researchers are looking for cooperation with a company interested in a licensing agreement. The subject of the licensing will be: device principle, detailed scheme, control diagram, and know-how for manufacturing of this advanced scanning X-ray fluorescence analyser.
- Specific area of activity of the partner: The university would like to cooperate with a partner from industry, who would like to manufacture the offered technology based on a licensing agreement.
The subject of the licensing agreement will be detailed description of the device principle and its scheme and know-how for manufacturing of this scanning X-ray fluorescence analyser.
The most significant advantage of the developed device is the possibility to scan selected area of an object surface and to vary the thickess of an analyzed surface layer.
Already on the market - The device is designed and tested and it has been already supplied to a customer.
Patent(s) applied for but not yet granted,Patents granted - Czech utility model granted.